Used WYKO / VEECO HD 2000 #9249550 for sale

WYKO / VEECO HD 2000 is a wafer testing and metrology equipment that is specifically designed for high productivity and accuracy. This wafer testing and metrology system utilizes an advanced 6-axis robotic mechanism which allows for precise sample positioning and analysis. This unit is used to test and measure semiconductor wafers, photonic components, data storage substrates, and other micro electro-mechanical systems (MEMS) devices. Each part of the machine is designed to support both production and research applications. The first component of WYKO HD 2000 tool is the high-performance optical microscope. This microscope utilizes advanced lenses and imaging technology to with provide extremely high magnification and resolution surpassing most other microscopes on the market. This microscope is used to inspect individual wafers for contaminants, defects and other irregularities. The second component of the asset is the data acquisition and autoexposure hardware. This model uses precision optomechanical components, digital imaging cameras, and a variety of high-speed image processing modules to give users real-time analysis of wafer quality. This equipment also allows operators to specialize settings to their specific applications. The third major component of VEECO HD-2000 is the high-performance wafer testing and metrology platform. This platform offers the user precise control over wafer testing and metrology, including the ability to directly mix gases for etching and patterning processes. This system is highly accurate and allows users to quickly and accurately characterize samples to obtain detailed results. The last element of this unit is the user interface. This user interface is designed to give the user ultimate control over the entire wafer testing and metrology process. This interface is also designed to simplify the process of wafer measurement and analysis, making it more accessible to a wide variety of users. VEECO HD 2000 is an advanced wafer testing and metrology machine that is designed to provide users with the highest levels of accuracy and speed for testing and measuring a wide variety of complex semiconductor and MEMS devices. With its combination of advanced optical microscopes, data acquisition and imaging hardware, and user-friendly interface, this tool offers an unparalleled capability for testing and metrology processes.