Used WYKO / VEECO HD 2000 #9378107 for sale

WYKO / VEECO HD 2000 wafer testing and metrology equipment is an innovative, high-performance optical inspection and metrology solution designed for semiconductor device fabrication. It is capable of providing highly accurate nanometer-scale measurements of multiple layers within a sample, as well as full 3-dimensional imaging of the sample. WYKO HD 2000 offers several advanced features that enable it to accurately analyze complex wafer structures with high precision. Its optical design offers high speed scanning and reliable data collection with a variable-in-plane resolution. It is also equipped with a spectral imaging system that can be used to capture different surface layers on the wafer, as well as a 3-dimensional optical profiler that can measure distances to a segment within a sample with nanometer precision. VEECO HD-2000 is highly suitable for analysis of more complex wafer structures that contain multiple layers, such as MEMS devices or photonics. It has an imaging unit capable of producing images at various angles, which allow for 3D imaging of the device. In addition, VEECO HD 2000 offers a co-axially aligned imaging machine with a high-aperture ratio that can capture more detail than conventional imaging methods. Other features of WYKO HD-2000 include a proprietary image acquisition software package, allowing operators to control the image resolution and target areas of interest. WYKO / VEECO HD-2000 is also capable of effectively analyzing unique structures on a wafer as well as capturing images of surfaces with a high degree of uniformity. HD-2000 is built with environmental considerations in mind, with high precision components designed to cope with varying conditions. This tool is reliable and easy to maintain, with long-term performance promises and regular updates continuing to extend its life expectancy. In summary, HD 2000 is an effective tool for the analysis and fabrication of complex semiconductor devices. It can provide highly accurate nanometer-scale measurements of multiple layers within a sample, as well as full 3-dimensional imaging, making it an invaluable asset to semiconductor laboratories.