Used WYKO / VEECO LDM300 #293652834 for sale
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WYKO / VEECO LDM300 is a wafer testing and metrology equipment designed to provide advanced level testing capabilities that extend into the high-resolution submicron level. This system supports a range of applications, most notably electrical testing and wafer characterization. WYKO LDM300 is equipped with an optimized 3D Laser Profiler with its proprietary 3D SEM technology to enable accurate characterization of the topography of the wafer surfaces. This technology also allows for the automated measurement of conductivity, resistivity, and other relevant parameters. The unit is equipped with a high-precision measurement platform and integrated dynamic imaging technology to enable high-quantity sample processing. This automated imaging technology offers various features such as top-down sample imaging, secondary electron imaging (SEI), optical measurement with up to 7 micron resolution, and pattern recognition for critical defect detection and analysis. Additionally, the machine can measure specimen surface, flatness, and non-contact wafer characteristics such as surface shape and thickness. VEECO LDM300 is designed to provide the highest level of accuracy, reliability, and reliability of results in wafer testing. Its low noise electronics and patented design enable advanced surface testing. The tool also supports further signal processing, feature extraction, pattern recognition and advanced analytics with the integrated optical systems control. Furthermore, the capabilities of the asset extend to include 3D printing and advanced patterning for Custom MEMS components. LDM300 is a versatile, powerful and accurate model that enables reliable and accurate measurement. It is well suited for advanced metrology and wafer testing, and provides reliable and accurate results with high throughput capabilities. The equipment is a cost-effective solution to enable the analysis and quality control of wafers in advanced research laboratories and semiconductor manufacturing facilities.
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