Used WYKO / VEECO NT 1000 #162176 for sale
Optical profiler Bench top Max. scan speed: 7.2 um/sec Sample stage: 4" (100 mm) Z-stage: manual Optics: single objective or manual turret; manual field of view multipliers (FOV) Manual focus VSI and PSI mode Machine metals MEMS/ BioMEMS Plastic and polymers Glass and ceramics Paper Coating Automotive parts Biomedical devices Statistical database Customizable results Full range of analysis tools Interactive 2D and 3D displays Texture analysis / S Parameters Confinement parameters Critical dimensions Histogram Step height Volume Multiple region analysis Power spectral density Magnification options: 5.0x, 10x, 20x, 50x with distance options from 3.5 mm to 9.5 mm.
WYKO / VEECO NT 1000 is an advanced surface metrology and wafer testing equipment designed to analyze the physical properties of micro-electronic and optoelectronic devices. It offers a wide range of capabilities for measuring critical surface parameters, such as flatness, film thickness, surface area, surface roughness and defects, as well as providing non-contact topography and imaging. The instrument combines several different measurement technologies, including white light interferometry (WLI), scanning electron microscopy (SEM), atomic force microscopy (AFM), prism coupler technology (PCT) and photolithography. With WLI, the system can map out surface topography down to Angstrom scale levels of accuracy. Using SEM and AFM, it can measure fine structural features and defects, and visualize feathered edges, step heights and small surface features. PCT makes it possible to measure flatness, film thickness, and UV absorption. The photolithography functionality provides imaging capabilities and is also used to identify features of interest on the wafer surface. WYKO NT 1000 is the most advanced of WYKO family of surface metrology tools, and features a wide variety of options and accessories, such as a spray-coating solution for measuring wet surfaces, a vacuum puck option for measuring samples without the need for a vacuum chuck, as well as a microscope to allow visual inspection of the sample. VEECO NT 1000 also offers advanced image analysis and contrast enhancement, as well as powerful software tools for data management and reporting. The software can be configured to control the unit and analyze data from multiple measurement technologies simultaneously. In summary, NT 1000 is an advanced surface metrology and wafer testing machine designed to analyze the physical properties of micro-electronic and optoelectronic devices. It offers a wide range of capabilities for measuring critical surface parameters and provides powerful image analysis and data management tools.
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