Used WYKO / VEECO NT 1000 #293595971 for sale

WYKO / VEECO NT 1000 is a wafer testing and metrology instrument used for a variety of advanced semiconductor process development and production applications. This equipment is designed for accurate measurement analysis on a wide range of semiconductor wafer dimensions. It extends metrology capabilities for MEMS, optical, and photonic devices far beyond traditional requirements. It provides accurate, repeatable measurements on a range of wafer sizes including 25, 50 and 125 mm diameters. WYKO NT 1000 is powered by a large, high resolution test head which allows users to make a variety of measurements. This test head has a 12-axis microscope head, a high-resolution Digital Image Correlation (DIC) system, a 3D digital interferometer, and an autofocus unit. The instrument also has a range of probes and testing options to measure parameters that are critical to device development and production. VEECO NT 1000 has a wide array of analytical capabilities and many user-friendly features. The machine software includes a number of powerful applications that allow for high speed analysis, data fusion, and comparison of different sets of data. This instrument also features an efficient user interface that allows users to quickly set up and analyze data gained from the test head. Furthermore, NT 1000 integrates a powerful software package to control the instrument and store data. The software allows users to automate measurements, program scan paths and processing tasks, store results and compare data after the measurement has been performed. This advanced software enables users to gain insights into digital device performance and detect errors earlier in the process. WYKO / VEECO NT 1000 is an extremely versatile tool that has many applications in metrology and semiconductor development. This instrument is perfect for processes including critical dimension metrology, device level parametric analysis, and power device tethering. Its reliable accuracy and wide range of testing capabilities make it a great choice for high-precision semiconductor analysis.