Used WYKO / VEECO NT 1100 #9409914 for sale

WYKO / VEECO NT 1100 is a non-contact, three-axis, scanning crystallographic system designed specifically for wafer testing and metrology applications. It combines highly advanced optics, automated stage control and patented scanning software to provide users with unprecedented capabilities for wafer-level imaging, analysis and control of device characteristics. WYKO NT 1100 uses a sub-nanometer XY stage to accurately position the wafer in the optical path, allowing for the collection of 3D data with nanometer accuracy. The system's advanced optics package includes a selection of laser sources and lenses, which accurately image and analyze features of varying size. VEECO NT1100 incorporates a twin optical head assembly that utilizes up to eight optical and two simultaneous high-speed convergence angles to ensure fast, accurate scanning and measurement of wafers. The integrated, user-friendly wafer metrology and analysis software allows users to easily acquire data, acquire images, and measure metrology and wafer characteristics with unparalleled accuracy. The integrated system also provides precise control of device characteristics, where users can specify process parameters to ensure that the wafer meets desired characteristics of focus, flatness, thickness, resistivity, dopant concentration, surface area, tilt and more. WYKO / VEECO NT1100's integrated process control capabilities have been extensively applied in the semiconductor and MEMS, automotive and consumer industries, allowing users to achieve unprecedented levels of accuracy in terms of wafer testing and metrology. Additionally, WYKO provides wafer processing and analysis support, with optional equipment such as automatic mapping systems, load ports, and ionization and deposition tools, to help users maximize their wafer processing and analysis capabilities. With its unique combination of precision and accuracy, NT 1100 is a powerful tool for achieving high levels of quality control in today's modern manufacturing environments. NT1100 captures high-resolution, 3D data quickly, accurately and reliably, streamlining the workflow in wafer testing and metrology applications.