Used WYKO / VEECO NT 2000 #293771050 for sale

WYKO / VEECO NT 2000 is a wafer testing and metrology equipment designed for non-destructive surface analysis of MEMS, semiconductor wafers, and other microelectronic components. It provides high accuracy measurements of surface defects, morphological features, and dimensional thickness. WYKO NT 2000 uses a state-of-the-art scanning capacitance microscope (SCM) that can be configured in either optical or atomic force configurations. Configuration can be changed quickly according to the application needs. The capacitive imaging mechanism used provides a high-resolution image of the sample surface that can easily be analyzed and measured. VEECO NT 2000 utilizes an advanced pattern recognition algorithm to identify the features of interest on the sample. This method eliminates the need to manually search through hundreds or thousands of SEM images to locate the features of interest. The software suite also allows users to measure the size and shape of structures on multiple surface layers. This capability is essential for process characterization, especially when different layer thicknesses must be monitored. NT 2000 also includes a unique feature called Scanning Acoustic Microscopy (SAM). SAM allows for non-destructive imaging and accurate thickness measurements of layers of materials on a wafer. WYKO / VEECO NT 2000 can also be used to inspect individual MEMS structures, such as wire bonds, bumps and cavities, as well as perform non-contact surface property measurements on many types of materials. In addition to all these features, WYKO NT 2000 also has a number of standard laboratory metrics, including an automated incident editor that allows users to accurately and precisely measure wafer surface roughness and topography. VEECO NT 2000 also has a powerful wafer handling system that is designed to facilitate wafer-to-wafer measurements. The unit is capable of moving multiple wafers simultaneously and precisely. NT 2000 is an ideal machine for both research and production environments. It is user-friendly, reliable, and provides superior accuracy and repeatability. Users can count on precise measurements when using this tool and results can be simply and quickly shared with colleagues via a variety of file formats.