Used WYKO / VEECO NT 2000 #9184218 for sale

WYKO / VEECO NT 2000 is a state of the art wafer testing and metrology equipment designed to facilitate high-accuracy wafer characterization. Utilizing a number of different metrology techniques, this system can quickly and precisely measure features on semiconductor devices with up to 16-bit accuracy. The core of WYKO NT 2000 is a 7-axis LINARI IUI C3-AX motion controller which allows for precise and accurate motions of the scanhead. This is combined with advanced digital video and laser scanning for unparalleled measurement with a 0.1nm resolution. VEECO NT 2000 has two scanning heads, one of which is a confocal laser scanhead. This is linked to a dual laser source and enables the visualization and quantification of surface topography. The second scanhead is a spectroscopic scanhead which is highly sensitive and capable of extremely low photon sources to enable measurement of the electronic properties of the sample wafer. NT 2000 also features advanced imaging capabilities such as color imaging, 3D imaging, and particle tracing. Furthermore, the unit is equipped with an incident light detector which allows for the capture of highly detailed metrics of the sample. To ensure repeatability and accuracy, WYKO / VEECO NT 2000 has comprehensive software capabilities. This includes calibration and control tools, image processing, data storage and analysis functions, and automated sample handling. The machine also offers secure remote access, allowing users to review and organize results securely from any location. All in all, WYKO NT 2000 is a cutting edge wafer testing and metrology tool. This asset offers groundbreaking precision, unparalleled flexibility, and imaging capabilities to enable accurate and fast measurements of any sample wafer. With its advanced capabilities and secure remote access, VEECO NT 2000 is an invaluable tool for any wafer testing and metrology application.