Used WYKO / VEECO NT 2000 #9313197 for sale

WYKO / VEECO NT 2000, from WYKO Instruments, is an industry-leading wafer testing and metrology equipment. This system enables 8-inch and 12-inch wafer testing and measurement of a variety of device characteristics. The unit integrates precise and accurate electrical measurements along with advanced imaging and non-contact measurements to accurately assess a wafer's characteristics and provide valuable information about the device performance. WYKO NT 2000 is based on a modular platform, which allows the customer to customize the machine to best fit their needs. It provides a variety of solutions, such as device characterization, wafer mapping, critical dimension (CD) metrology, spectral reflectance, simple device test and deprocessing capabilities. Its modular structure allows for a variety of analysis solutions to be configured in order to measure and analyze various aspects of a device or process. The tool is equipped with a multidirectional wafer stage, laser interferometric measurement asset, high-resolution vision model, motion module, and an electrical characterization equipment. This allows for a variety of electrical measurements such as sheet resistance, sheet capacitance, leakage, and Hall measurement. Its electrical characterization system is designed to provide reliable and repeatable electrical measurement results. Its multidirectional wafer stage and interferometric measurement unit permits non-contact scanning and acquisition of accurate 3-Dimensional (3D) data measurements. It also includes a powerful array of acquisition tools, such as stereo imaging and scanning capability, as well as statistical process control tools. This allows for the simultaneous analysis of multiple parameters, which helps to ensure a higher accuracy of the overall measurement results. VEECO NT 2000 includes a dedicated software package, which provides automated tools for data acquisition and analysis. The software enables data from multiple instruments to be integrated and analyzed, as well as eliminates manual data entry. It also includes advanced imaging and analysis capabilities, as well as powerful measurement capabilities. In conclusion, NT 2000 is a powerful wafer testing and metrology machine, which provides advanced imaging, non-contact scanning, and electrical characterization capabilities. It is designed for 8-inch and 12-inch wafers, and is capable of analyzing a variety of device parameters. Its software package simplifies data acquisition and analysis, and eliminates the need of manual data entry.