Used WYKO / VEECO NT 2000 #9395158 for sale

WYKO / VEECO NT 2000 is a wafer testing and metrology system that has been designed to measure and characterize multiple layers of material in a single scan, providing a detailed top-down view of the material surface. WYKO NT 2000 uses advanced hardware and software components to allow rapid imaging and accurate analysis of the surface. The system uses multi-frequency interference microscopy to generate high resolution topographic images of microstructures, including sidewalls and features as small as 90 nm. The software also uses peak detection and fitting algorithms to accurately measure a wide range of critical dimensions. The addition of an automated stitching module allows the measurement of larger fields of view with greater accuracy and speed. VEECO NT 2000 includes a wide range of metrology options. It has a high-resolution laser scanning optical profiler for measuring complex 3D features. It also includes an interferometer and a diffractometer for measuring thin films in nanometer thickness range. It also includes an ellipsometer for measuring optical characteristics of thin films such as optical constants (refractive index and extinction coefficient). NT 2000 is designed to maintain high throughput rates and accuracy for batch production metrology needs. The system also comes with a proprietary software package for automation and programmability. This simplifies execution of test recipes and allows for data acquisition from multiple wafers in a single run. WYKO / VEECO NT 2000 is a powerful tool for semiconductor manufacturing process control. It provides high resolution imaging data, accurate metrology results, and full compatibility with the most popular automated probers. It is also highly reliable and easy to use. WYKO NT 2000 is a great choice for precise, automated batch production metrology.