Used WYKO / VEECO NT 3300 #293586673 for sale

WYKO / VEECO NT 3300 is a cutting-edge wafer testing and metrology equipment designed for precise on-site measurement and monitoring of semiconductor wafers. Utilizing its patented Adaptive Edge Detection (AED) technology, WYKO NT 3300 can measure the edge size and shape of almost any semiconductor wafer with industry-best accuracy. VEECO NT 3300 is designed to accommodate various wafer sizes and thicknesses. It utilizes a three-axis motorized stage with adaptation for edge recognition and tracking arms to follow the wafer's shape, ensuring precise alignment and measurement of wafer edges. NT 3300 is connected to a data acquisition system that records real-time edge measurement data. Data can be acquired over a wide range of frequencies, up to 1 MHz. The results are acquired and saved to a secure database where they are instantly available for review or analysis. The unit is also capable of Automatic Edge Profile Generation (AEPG) to identify potential inconsistencies in your wafer's shape. This feature produces an edge profile graph which illustrates the wafer's smoothness, edge shape, and bevel characteristics. WYKO 3230 combines advanced monitoring technology with user-friendly software interface. The intuitive graphical and menu driven software makes it easy for users to perform and review edge measurement measurements, as well as to generate comprehensive reports and statistical data. WYKO / VEECO NT 3300 is designed for ease of use and operates without elaborate setup procedures. It can acquire data from multiple test sites either sequentially or simultaneously. Its precision measurement capabilities make it a valuable tool for quality control and production optimization for semiconductor manufacturers. In addition, its advanced software and technology allows for integration of data from multiple sources, such as Automatic Test Equipment (ATE). WYKO NT 3300 is one of the most advanced wafer testing and metrology machine in the industry and is ideal for fast, accurate measurements of on-site wafer edges. Its intuitive software and reliable data acquisition tool make it an indispensable tool for semiconductor production and quality control.