Used WYKO / VEECO NT 3300 #293592821 for sale

WYKO / VEECO NT 3300 is an integrated metrology equipment for advanced wafer testing and metrology. It is a multi-sensor system that combines critical imaging and non-contact metrology capabilities, enabling users to quickly and accurately characterize semiconductor and other advanced materials. WYKO NT 3300 unit includes two powerful sensing technologies in a single platform: optical and electrical. The optical sensor is a high-resolution microscope that enables wafer inspection, while the electrical sensor measures individual device characteristics and parameters, such as transconductance, current-voltage curves and breakdown voltage. VEECO NT 3300 machine has a wide selection of probes, along with specialized drivers and software, that are designed to accurately measure a range of device parameters. The probes are interchangeable and can be used with a variety of measurement scenarios and specifications. Some of the more common measurements that can be performed on NT 3300 include testing GaAs and other III-V compound semiconductor devices, high temperature device characterization and testing low power devices such as MOS devices. It also supports 2D image stitching and measurement for large scale nanotechnology devices, blind via bridging control and measurement, high speed transient probing, position-to-position bumping, real-time Leakage/Breakdown/Resistance/Capacitance testing, and noise model parameter extraction. WYKO / VEECO NT 3300 is also a powerful wafer testing tool as it supports a wide variety of analytical models and offers multiple scanning options. It allows users to customize the scanning area, scan amplitude, and data acquisition rate for a wide selection of measurements. It also provides enhanced image analysis capabilities that include image stitching and feature extraction algorithms. WYKO NT 3300 tool is designed to be highly reliable and uses comprehensive real-time wafer inspection and measurement techniques. It is also equipped with advanced user control features, including auto calibration, automated probing, and visual inspection tools. Overall, VEECO NT 3300 is an integrated metrology asset designed to meet the most demanding wafer testing and metrology requirements. It combines both optical and electrical sensing technologies in a single package, enabling users to quickly and accurately measure device characteristics, perform wafer testing and characterize advanced materials.