Used WYKO / VEECO NT 3300 #293645434 for sale

WYKO / VEECO NT 3300 is a wafer testing and metrology equipment that processes and analyzes wafers at production speeds, allowing for efficient and accurate wafer testing. It can be used for both planar and 3D wafer dimensional measurement, including surface and sidewall profile measurements, topography measurements, and films thickness measurements. The system is designed for process control applications such as for etch rate, planarity and overlay. It uses a non-contact optical interferometry to precisely measure both two- and three-dimensional surface profiles. Features can range from a few nanometers to a few micrometers. WYKO NT 3300 is built on a robust and reliable software platform, providing an integrated solution with various hardware and software options. VEECO NT 3300 includes a fast optics unit, which enables profile scan speeds up to 250 μm/second, significantly faster than conventional methods. The machine also has a fully automated calibration tool and full metrology report capabilities. It offers a wide range of metrology tools, such as rapid scan algorithms, low-noise electronics, high-precision stages, transmissive and reflective optics, and enhanced pattern recognition. This asset can measure multiple samples per wafer at a time and has onboard data storage that can store up to 10 wafers at a time. NT 3300 offers software-controlled wafer handling, including wafer movement and alignment, as well as automated sample stage control and mapping. It also features automated model diagnostics, streamlined workflow management and customizable report generation. Additionally, the equipment has integrated environmental control for uniform temperature performance across multiple samples. In summary, WYKO / VEECO NT 3300 is a reliable and fast system for wafer testing and metrology. It has a non-contact optical interferometry that can measure features from a few nanometers to a few micrometers and a fast optics unit with scan speeds up to 250 μm/second. It also provides enhanced workflow, convenient data storage and advanced sample handling capabilities. It is a highly advanced wafer testing and metrology machine that is well suited for process control applications.