Used WYKO / VEECO NT 3300 #293800423 for sale

WYKO / VEECO NT 3300 is a wafer testing and metrology equipment used in semiconductor manufacturing. It offers an automated, non-contact test and metrology solution, allowing users to obtain critical surface and sub-surface metrology data quickly and with quality. WYKO NT 3300 utilizes a three-axis motion system to produce nanometer-scale probes to the surface of the wafer, whilst simultaneously acquiring high-resolution images. This combination of motion and imaging systems provides an excellent way to measure profile data, and other surface metrics. As well, these systems provide a high level of accuracy, as well as repeatability, enabling reliable measurements over an entire wafer. VEECO NT 3300 also integrates a proprietary mapping stage, coupled with Scan-image to provide fully-optimal nanometer-scale and millimeter-scale probing. This allows users to accurately measure a range of features including small features on large wafers. The unit also features advanced analysis tools, designed to quickly and accurately assess wafer surface characteristics. Due to its non-contact approach, NT 3300 machine provides a safe and efficient process for wafer testing and metrology. It is able to measure a range of surface and sub-surface characteristics with a variety of metrology probes and techniques. These include optical confocal scanning microscopy, atomic force microscopy, and x-ray photoelectron spectroscopy. WYKO / VEECO NT 3300 tool also features a number of features designed to ensure quality, and ease-of-use. This includes a built-in wafer mapping asset, and a robust user interface for easy operation. In addition, the model also features a variety of analysis packages designed to optimize wafer testing, and provide the most accurate results. WYKO NT 3300 equipment has been designed to provide quick and accurate results, with a high degree of repeatability. Its combination of imaging and motion technologies, along with its robust user interface and analysis packages, enables users to obtain critical metrology data quickly and with quality. These features make VEECO NT 3300 an ideal system for wafer testing and metrology.