Used WYKO / VEECO NT 3300 #9003738 for sale
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Optical profiler Objectives: 5x, 50x Magnification: 1x, 0.5x, 0.75x Alignment TMC (Active isolation table) Stages: 8x8 / 6x6 Motorized tip tilt Motorized X, Y, Z stage PC Pentium: 1 GB (Boards included in PC) Cables Black and white monitor, 9" Autofocus option included Analog signal output.
WYKO / VEECO NT 3300 is a wafer testing and metrology system manufactured by the Nanometrics company. This device is used to measure, characterize, and test materials used in the production of integrated circuit chips. WYKO NT 3300 is designed to measure numerous characteristics such as topography, surface morphology, uniformity, and charge profile. An integrated CCD camera with variable digital magnification capabilities helps to provide accurate measurements and data. The device also features dual laser scanning and digital reference surfaces for improved accuracy. VEECO NT 3300 also has an integrated wafer mapping system that enables users to rapidly identify performance or conformity issues with high-volume wafer stacks. This ensures high-quality yield at high speeds. NT 3300 also allows users to access and configure digitized metrology information remotely, so resources can be easily managed and optimized. This device also allows for quick testing of process parameters such as temperature and pressure, so users can customize their testing for each application's needs. WYKO / VEECO NT 3300 is ideal for low- to mid-volume production requirements due to its versatility, its low cost of ownership, and its speed of operation. It is appropriate for use in a wide range of applications such as semiconductor manufacturing, photonics, nanotechnology, and more. WYKO NT 3300 is a robust, efficient device that is precision engineered and built for the demanding needs of wafer testing and metrology. Its versatility, accuracy, and ease of use make it an ideal choice for users looking for a reliable and cost-effective testing solution.
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