Used WYKO / VEECO NT 3300 #9105672 for sale

ID: 9105672
Vintage: 2002
Automated optical profiler 2002 vintage.
WYKO / VEECO NT 3300 is an advanced wafer testing and metrology equipment that offers top-level precision, accuracy, and repeatability. It enables users to measure a wide range of semiconductor wafers from 3" to 8", as well as chip samples on wafers up to 400mm in size. The system features a CCD-based microscope module that provides fast, accurate imaging, and automated measurements. It also offers an industry-leading range of modules and features, including: full-customizable test plans for integrated circuit designs, integrated 2D and 3D analysis of test results, automated defect analysis, and customizable reporting and fail-decision algorithms. WYKO NT 3300 utilizes advanced algorithms for automated measurements and provides cost-effective testing performance. It offers fast automatic alignment and high-resolution imaging with resolutions up to 0.25µm/pixel from the top view. The unit also provides the ability to adjust focus position, record multiple measurements, and adjust illumination level. Additionally, VEECO NT 3300 offers multiple fixed and varying field of view capabilities, providing users with the flexibility to select the best view for a specific measurement. NT 3300 has an intuitive user interface that allows users to quickly configure tests. It also provides support for external peripherals, such as cameras and display systems. Additionally, the machine has a powerful control and data acquisition tool that enables precise measurements at high throughput. WYKO / VEECO NT 3300 also includes an automated synchronization feature that permits correlated measurements of multiple base frame units. This feature ensures consistent testing even when multiple users are collaborating on the same task. Additionally, the asset supports a range of third-party software add-ons, increasing its flexibility and enabling users to extend its capabilities with custom programming. Overall, WYKO NT 3300 offers an exceptional wafer testing and metrology model with advanced features. It provides users with high levels of accuracy, repeatability, and automation, making it an ideal choice for anyone who needs to measure a wide range of semiconductor wafers or chip samples. Its advanced algorithms and various peripheral compatibility options make it an excellent equipment for all types of users.
There are no reviews yet