Used WYKO / VEECO NT 3300 #9150830 for sale

ID: 9150830
Vintage: 2000
Profilometer 2000 vintage.
WYKO / VEECO NT 3300 is a wafer testing and metrology equipment that provides a wide range of unique features and capabilities, including in-depth process characterization, fault detection, imaging, and analysis of integrated circuit (IC) structures. The system is designed to enable users to quickly and accurately measure and evaluate ICs as they are being developed and manufactured. WYKO NT 3300 offers a number of innovative design features, such as an automated motorized wafer handling unit for rapid and precise wafer alignment, high speed metrology, wafer mapping options, and a various of scanning electron microscope (SEM) electrical test equipment. The machine's convenient user interface simplifies workflow and ensures accuracy and repeatability of measurements. VEECO NT 3300 also provides powerful metrology functions for both electrical and physical measurement. It offers a wide range of electrical measurements, such as resistance, capacitance, and conductivity tests. It also has built-in electrical stimuli for fault isolation, as well as direct current and radio frequency (RF) measurements. Its physical metrology capability includes stress/strain detections and plastic measurements, as well as non-contact surface analysis. In addition, the tool offers a unique feature of automated stage inspection with profiling capability to verify manufacturing processes. The asset's imaging capabilities allow users to detect, isolate, and analyze process defects quickly and accurately. It is capable of capturing and analyzing images of the ICs using laser scanning microscopy or scanning electron microscopy (SEM) tools. Its imaging features also include a 3D cross-section measurement that can capture high-resolution images automatically, in both single and multiple layers. Finally, the instrument offers a variety of hardware and software options to meet a range of industry needs. It can be equipped with a variety of custom probes, such as a paddle probe, capacitance probe, and thermocouple that help overcome some of the limitations of conventional test systems. The software provides automated data analysis and report generation to make the whole process efficient and repeatable. Overall, NT 3300 is an effective and reliable model for wafer testing and metrology. With its wide range of features, including automated motorized wafer handling, high-speed metrology, imaging, electrical tests, and a variety of probes, it is an ideal choice for advanced IC development and manufacturing.
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