Used WYKO / VEECO NT 3300 #9221759 for sale

ID: 9221759
Optical profiler.
WYKO / VEECO NT 3300 is a state-of-the-art wafer testing and metrology equipment designed to accurately measure the attributes and performance of semiconductor wafers. The system offers advanced capabilities for measuring: surface roughness, height/refractive index, sheet resistance, optical reflectivity, and more. WYKO NT 3300 is a high-precision unit that offers excellent repeatability and outstanding performance. It features an advanced tool control machine designed to improve the accuracy of measurement results. The tool also includes a number of analytical tools to ensure accurate evaluation of wafer characteristics, including a 3D imaging asset that provides an enhanced image of the wafer surface. VEECO NT 3300 is equipped with a variety of options such as a wide range of probe tips, automated sample handling, and a sophisticated software suite to ensure optimal performance. This model provides a complete and precise automated wafer testing and metrology solution. The features of NT 3300 include a high-precision stage for scanning wafers, a CCD camera which provides the highest quality image of the wafer surface, as well as a powerful set of analysis tools for performing surface and sheet resistance measurements. The equipment also includes a selection of modules for automation such as sample handling, optics, and an integrated data acquisition system. All these powerful features are packed in an easy-to-use unit that ensures high accuracy and repeatability when testing and measuring wafers. WYKO / VEECO NT 3300 is also designed to reduce costs and improve productivity, thanks to its advanced automation and easy-to-use interface. WYKO NT 3300 is an excellent choice for semiconductor professionals looking for a high-performance wafer metrology machine. It offers superior performance, excellent repeatability, and a comprehensive selection of modules for automation. With its powerful set of features, the tool provides an unbeatable solution for testing and measuring wafers.
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