Used WYKO / VEECO NT 3300 #9309117 for sale

WYKO / VEECO NT 3300 is a wafer testing and metrology equipment designed for the electrical, optical, and mechanical characterization of semiconductor and MEMS devices. It enables the accurate measurements and analysis of individual devices on a wafer or individual samples. The device features a three-axis vertical motion (Z-Axis) stage and a four-axis horizontal rotation (XYØ) stage, enabling fast and precision wafer mapping and profiling. It offers an array of options for high-resolution sample mapping and measurement, including point-by-point profiling, area mapping, line-by-line mapping, and photoshop integration. The system is capable of measuring material properties such as surface roughness, wafer thickness, and surface topography, as well as electrical properties including sheet resistance, device capacitance, and leakage current. It also has built-in techniques for automated particle count, focused ion beam imaging, automated step height measurements, and automated overlay measurements. The unit has an intuitive, easy-to-use user interface that allows for a variety of data export and report creation options such as HTML and PDF formats. Data processing tools allow users to quantify, compare, analyze, and visualize wafer or device data in detail. The machine offers a wide range of options for customization, including integration with other test systems. In addition, the tool has a number of advanced automation features for optimizing setup, aligning features, and initiating repeatable tests. It can be set to automatically transition from one measurement to the next, making it capable of automatically batch testing up to 128 wafers in a single run. Overall, WYKO NT 3300 is a highly reliable, precise, and efficient wafer testing and metrology asset that is capable of providing comprehensive data for a wide range of applications. Its advanced, automated features make it an ideal choice for automated wafer and device characterization.