Used WYKO / VEECO NT 3300 #9375264 for sale

ID: 9375264
Vintage: 2005
Optical profiler 2005 vintage.
WYKO / VEECO NT 3300 is a leading-edge wafer testing and metrology equipment. Designed specifically for integrated circuit (IC) and thin-film research and development, it is an invaluable tool for accurately measuring and analyzing critical parameters related to IC device processes. WYKO NT 3300 combines a powerful optical imaging and analysis system with a highly precise, high-resolution 3-axis positioning stage. The imaging unit incorporates a high-resolution visible light sensor array and a secondary infrared sensor array, allowing users to accurately measure the properties of their ICs at multiple stages. VEECO NT 3300's advanced imaging analytics capabilities allow users to accurately and reliably measure reflectivity, contrast, and uniformity in order to evaluate and assess the shape, surface, and other highly precise characteristics of their IC devices. The 3-axis positioning stage, which is controlled by a separate motion controller, is capable of precise motion control up to 25um/sec. This allows for precise, real-time measurements at multiple locations for precise device performance evaluation. Combined with NT 3300's advanced analytics features and powerful software package, users can quickly and accurately collect, analyze and display comprehensive information about their IC devices. In addition to its imaging and motion control capabilities, WYKO / VEECO NT 3300 also features an industry-leading wafer handling machine. The wafer handler is designed to provide seamlessly integrated wafer transport, allowing users to rapidly change wafers without stopping the test or shutdown tool. This allows users to fine-tune or optimize their test or metrology process without interrupting their production flow. WYKO NT 3300 is an exceptionally versatile and accurate asset. The combination of its high precision 3-axis positioning stage, powerful imaging analytics, and flexible wafer handling capabilities make it an ideal model for the evaluation and optimization of IC device processes. Its fully-comprehensive analysis, data collection, visualization, and reporting capabilities make it a valuable tool for any IC research and development lab.
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