Used WYKO / VEECO NT 8000 #183083 for sale

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ID: 183083
Optical profiler Win XP-Pro sp3 100um/sec Scan speeds, 8mm scan height Scan speed 1x,3x,11x,20x Three modes scan speed vsi, psi, evsi (enhance vsi) 200mm (8") scan stage computer control with encoders Motorize 4 position turret with auto detect Full automation with internal reference signal (laser guide) Enable self calibrating accuracy over the entire scan range Integrated air table Objectives: 5.0x fov 2.47x1.88 with .55x; 50.0x fov 0.25x0.19 with .55x 5.0x fov 1.24x0.94 with 1.0x; 50.0x fov 0.12x0.09 with 1.0x Including 10x lens Light source using fiber to eliminate thermal interference High speed auto focus, tip/tilt stitching optional (included) 2005-2006 vintage.
WYKO / VEECO NT 8000 is a high-performance metrology and wafer testing equipment designed to deliver enhanced accuracy and repeatability to the semiconductor manufacturing process. The system is made up of four components: a custom-built optical surface profiler (OSP), an optics-based non-contact 3D surface profiler (NCSP), a measurement controller, and a software suite for analysis and report generation. The OSP utilizes a low-coherence light source to provide reliable results from surface scan measurements, while the NCSP uses a temperature-controlled, optics-based unit to measure 3D surface profiles. Both use a high-pressure, high-vacuum chamber for sample cooling and a vacuum chamber for wafer loading. The measurement controller is designed to integrate the results from both OSP and NCSP systems, providing automated control of the measurement process and providing high-precision performance. It also provides an intuitive user interface which enables users to easily configure their metrology and testing requirements. WYKO NT 8000 software suite includes both data acquisition processes and analysis tools which allow users to quickly analyze and present data. The suite includes advanced features such as data reduction and error-correction algorithms, allowing users to more accurately determine measurement results. Additionally, the software suite provides automated report generation and storage, allowing users to quickly review, report, and act on performance results. Overall, VEECO NT8000 metrology and wafer testing machine is an ideal choice for semiconductor manufacturers and researchers seeking to increase performance and accuracy. By combining optical surface profiler and non-contact 3D surface imaging with a powerful and easy-to-use suite of software tools, VEECO NT 8000 enables users to easily monitor, analyze and optimize their processes for maximum efficiency and performance.
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