Used WYKO / VEECO NT 8000 #9204114 for sale

WYKO / VEECO NT 8000 from WYKO is an advanced metrology and wafer testing equipment. It is designed to provide precise, accurate, and reliable data for process and device characterization, defect and failure analysis, metrology, and other semiconductor applications. It is capable of handling a wide range of substrates including patterned, as well as unpatterned, thin and thick film layers. The system consists of an optical head that incorporates a high speed video camera and a laser interferometer for measuring the thickness of thin layers, as well as a scanning electron microscope. The scan rate of the electron microscope is adjustable to provide high-resolution images of the surface of semiconductor structures. It also features a digital input interface that connects to an Optical Character Recognition (OCR) unit for measurement of line widths and other dimensions. WYKO NT 8000 machine is equipped with a range of software packages to support the measurement and analysis needed for semiconductor device characterization. It is capable of handling multiple measurements and analyzing various parameters, such as trench depths, topographical profile, overlay registration, and failure regions. It can be used for commercial testing applications as well as for research and scientific studies. The tool has a large imaging chamber to provide uniform particle illumination for recording dynamic and static metrology measurements. Its optical head includes an integrated illumination module to provide optimized illumination and improve asset accuracy and repeatability. VEECO NT8000 can be used with a variety of automation systems and can be equipped with a variety of package and probe card styles. The model features built-in environmental dynamic measurement to improve measurement accuracy and efficiency. It also offers a variety of data acquisition tools to support the rapid collection and processing of device data. It is designed to support the highest sensitivity measurements for a variety of device characterization applications. Overall, WYKO / VEECO NT8000 from VEECO provides the accurate, rapid, and reliable data collection required by semiconductor device manufacturers. It is capable of handling thin and thick film layers, as well as patterned and unpatterned substrates, and offers a wide range of software packages to support process and device characterization. Moreover, its built-in environmental dynamic measurement and data acquisition tools make it an excellent choice for semiconductor manufacturers.