Used WYKO / VEECO NT 8000 #9309123 for sale

WYKO / VEECO NT 8000 is an advanced wafer testing and metrology equipment. It provides comprehensive wafer characterization, metrology, and process monitoring capabilities. Designed to work effectively in a variety of fab environments, WYKO NT 8000 is a highly advanced system that utilizes state-of-the-art optics, measurement technologies, and process analysis software to optimize fab throughput and yield. VEECO NT8000 features an on-axis, non-contact optical imaging unit that provides ultra-high resolution measurements with minimal drift. The machine can accommodate a wide range of wafer sizes and orientations, and can easily integrate with the most modern fabs. With a large field of view and low magnification, NT 8000 captures images of full wafers at high speed, and can also capture single die images. The advanced illumination provides high-resolution imaging for both bright-field and dark-field imaging. VEECO NT 8000 also includes an enhanced metrology capability. This feature enables highly accurate measurements of semiconductor parameters such as linewidth, sidewall angle, critical dimension (CD), zero scan of CDs, and variance. The tool is also capable of performing alternate metrology techniques, such as scatterometry and photometry. WYKO NT8000 offers the highest precision available, and is suitable for a wide range of applications. NT8000 also features an advanced defect detection asset that can detect defects as small as 75 nm. It combines four advanced technologies — bright-field, dark-field, UV fluorescence, and scatterometry — to enable fast and effective defect detection. Additionally, the model employs high resolution imaging for complex pattern recognition. WYKO / VEECO NT8000 also features enhanced process analysis software. This software enables instant, accurate process performance analysis, helping to minimize the time it takes to identify and address process issues. The software incorporates sophisticated wafer-to-wafer comparison tools, and a drag-and-drop graphical user interface for user-friendly access to data. WYKO / VEECO NT 8000 is an advanced wafer testing and metrology equipment that is designed to maximize fab throughput and yield. Its advanced optical imaging capabilities, metrology features, and process analysis software enable quick and accurate measurement of a variety of semiconductor parameters. The enhanced defect detection system allows for effective defect detection and process performance analysis. All of these features and capabilities make WYKO NT 8000 a highly capable wafer testing and metrology unit.