Used WYKO / VEECO NT 8100 #9211301 for sale

WYKO / VEECO NT 8100 is a wafer testing and metrology equipment specifically designed for quality control and failure analysis in the semiconductor industry. This system combines an automated WYKO series NanoScratch and Horizontal Deflection Analysis (HDA) with the optical-based VEECO Navi-Scan for 360 degree coverage. It can measure, analyze, and track wafer surface characteristics, defects, and particle metrology. WYKO NT 8100 is built on a tabletop design for easy access, and its hardware components are integrated to provide consistent measurements and analysis along the entire wafer surface. WYKO / VEECO series NanoScratch is a non-contact wafer deformation inspection unit which can accurately measure both long and short-range stress variations at nanoscale levels. It can track properties such as surface adhesion, hardness, stiffness, uniformity, and residual stress. The HDA machine allows for high-resolution imaging of a wide range of structures and features and detailed analysis of surface damage and other defects. WYKO Navi-Scan uses physically-based imaging technology to accurately capture features and particles in three-dimensions, thus providing precise metrology of particle density, size, and shape. VEECO NT 8100 is controlled by VEECO Smart Tool Control Interface (SCI), offering automated data collection, integration with other systems, and sophisticated analysis tools for efficient performance. The SCI allows users to customize settings, set up scripted multi-step experiments, and generate detailed custom reports. Additionally, the SCI is compatible with common wafer inspection software solutions such as Fab Operator and Fab Inspector. Overall, NT 8100 asset provides a comprehensive solution for wafer testing and metrology, helping ensure the consistent production of quality semiconductor products. With its compact design, automated data collection, and wide range of analysis and metrology capabilities, this model is ideal for efficient and accurate production process monitoring, quality assurance, and failure analysis.