Used WYKO / VEECO NT 9100 M #9208129 for sale
WYKO / VEECO NT 9100 M is a precision wafer testing and metrology equipment designed to provide maximum precision and accuracy for non-contact surface analysis of wafers and thin film structures. This system utilizes a combination of multiple systems including automated optical microscopy (AOM), scanning electron microscopy (SEM) and capacitance imaging (CI) to provide accurate analysis of the surface of wafers and thin film structures. WYKO NT 9100 M consists of three main components; a stage, an illumination unit, and a detector. The stage is capable of supporting objects up to 1000 x 1000 mm in size. It can move in either a linear or rotary manner and can be driven at speeds as fast as 0.02 micrometers per second. This is necessary to achieve the high levels of precision and accuracy required in wafer testing and metrology. The illumination machine consists of either visible or infrared light sources to provide optimal contrast for surface analysis. Finally, the detector is capable of collecting image data from the illuminated wafer surface with a resolution of 0.7 µm and a dynamic range of 2 orders of magnitude with a SNR of > 80 dB. VEECO NT 9100 M can analyze both planar and non-planar wafer surfaces. The tool is capable of measuring relative thickness, film adhesion, surface defects, and topology. It can also identify the occurrence of TiN deposition on the wafer surface and measure grain size and depth. In addition, the asset can measure surface reflectivity. All of this data is recorded using a confocal control model, which can be used to analyze the captured data to yield important metrics for process control or modeling. NT 9100 M offers a number of features for accurate wafer testing and metrology. It can be operated remotely with a dedicated control workstation, eliminating the need to be physically present for analyzing wafers and thin film structures. The confocal control equipment is secure and fully customizable, allowing for a wide range of configurations to meet the specific requirements of a variety of applications. Finally, the system offers a range of software tools and analysis packages that can be used to generate reports and analysis of the captured data. In summary, WYKO / VEECO NT 9100 M is a precision wafer testing and metrology unit designed for non-contact surface analysis of wafers and thin film structures. It utilizes a combination of AOM, SEM, and CI to provide accurate analysis of wafer surfaces. The machine offers features such as automated stage movement and customization, remote operation, and a range of software tools and analysis packages. All of these features make WYKO NT 9100 M an ideal choice for applications that require accuracy and precision in wafer testing and metrology.
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