Used WYKO / VEECO NT 9800 #9289675 for sale

WYKO / VEECO NT 9800
ID: 9289675
Vintage: 2010
Profiling system 2010 vintage.
WYKO / VEECO NT 9800 Wafer Testing and Metrology Equipment is a highly versatile and reliable instrument capable of providing solutions for a wide range of metrology applications. The system is suited for testing large area semiconductor wafers, providing detailed analysis and characterization of materials' physical and electrical properties. The unit consists of a main machining station, a wafer stage with a motorized Z-axis, a scan head with optical projection machine, and advanced metrology software. The wafer stage rotates a maximum of 200 mm diameter substrates to provide a uniform optical view of the wafer across its entirety. Rotation of the wafer is controlled via an external computer and encoders built into the stage providing precise, non-contact, data points of the wafer's surface. One of WYKO NT 9800's key features is its optical projection tool that provides for simultaneous viewing of multiple sites across the wafer simultaneously. With a fixed position scan head, the device measures up to twenty-eight points at up to twelve sites so that multiple images can be captured in parallel view. This allows for rapid analysis of wafer topography at a high level of accuracy. The advanced metrology software that accompanies VEECO NT 9800 is capable of generating a range of analytical data such as topography, critical dimension, and residual stress profiles. The software also comes packaged with proprietary fitting algorithms designed to simplify the interpretation of complex data sets. Furthermore, the integrated software development environment allows for custom integral imaging analysis software to be built from scratch. Finally, NT 9800 is designed for extreme reliability and repeatability, with a high data-acquisition speed and built-in environmental control. Its integrated nitrogen-purged chambers provide precise temperature control and vibration isolation necessary for measuring delicate wafers with reproducible results. The integrated user management asset provides full traceability of all test data. Overall, WYKO / VEECO NT 9800 Wafer Testing and Metrology Model is a powerful instrument that offers a wide range of metrology applications. Its advanced optical projection equipment and metrology software make it ideal for rapid, repeatable, and accurate analysis of large area semiconductor wafers. Furthermore, its integrated user management system guarantees reliable and traceable data.
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