Used WYKO / VEECO NT 9800 #9301086 for sale

WYKO / VEECO NT 9800 is a high-performance wafer testing and metrology platform designed to help semiconductor manufacturers accurately measure characteristics of their wafers and other components. The platform combines fully automated optical inspection, advanced 3D imaging techniques, and integrated metrology processes to deliver accurate data points and reliable results. Key features of WYKO NT 9800 include high/low-speed scanning, high resolution metrology, advanced 3D imaging capabilities, automated sample handling capabilities, advanced imaging analysis, high-throughput data acquisition, and automated device evaluation. VEECO NT 9800 offers multiple types of metrology capabilities, including capacitance, electrical resistivity, stress, mobility, and profile measurements. The system is able to map widely varying surface topographies, and uses highly refined equipment such as multi-head scanners and 3D imaging systems to do so. Through advanced 3D imaging, detailed information such as crystalline structures and fine topographical features can be accurately mapped and analyzed. In addition, NT 9800 is also equipped with an automated sample handling system which allows it to simultaneously manage multiple wafers and components. Using wafer cassettes, the Auto-Loader feature allows for a continuous flow of samples through the system as wafers are automatically loaded onto the processing spindles, allowing multiple wafers to be tested quickly and accurately. WYKO / VEECO NT 9800 has multiple scanning options including high- and low-speed scanning, which allows for fast and detailed characterization of a wafer or component. The high-speed scan uses an average acquisition rate of 1 million data points per second and provides unrivaled resolution and accuracy while maintaining an extremely fast scan rate. The low-speed scan, on the other hand, is optimized for slower scan times and delivers a more detailed three-dimensional reconstruction of the sample under the microscope. Finally, WYKO NT 9800 also offers high-throughput data acquisition that allows for quickly collecting and analyzing a large number of wafers in a single scan. The data acquired through this process can be used in real-time device evaluations, allowing manufacturers to quickly and accurately assess the quality and characteristics of their wafers and components. In conclusion, VEECO NT 9800 is a highly advanced wafer testing and metrology platform that delivers highly accurate and reliable data points for semiconductor manufacturers. With its automated sample handling capabilities, high-speed scanning, advanced 3D imaging capabilities, and high-throughput data acquisition, NT 9800 is a powerful and versatile platform for analyzing wafers and other components.