Used WYKO / VEECO SP 3000 W #9241021 for sale

WYKO / VEECO SP 3000 W is a wafer testing and metrology equipment. It is designed for precise examination and quantitative analysis of thin-film optical characteristics on patterned and un-patterned wafers. WYKO SP 3000 W is composed of several components, including a WYKO 4 inch platen and a VEECO 4 inch platen for wafer handling capabilities, a low-light benchtop photometer for measuring thin-film optical characteristics, and an automated software suite for automated measurements and analysis. WYKO / VEECO 4 inch platen is a motorized wafer handling system that provides reliable pick-and-place capability from cassette and onto WYKO 4 inch platen. This platen can accommodate a broad range of wafer sizes, from 3.5 inch and 4 inch, and offers automated soldering, adhesive dispensing, and alignment using the integrated vacuum unit. VEECO 4 inch platen is a heavy-duty wafer handling machine that offers precise alignment, movement, speed, and pressure. It can handle up to twenty wafers in a cassette and offers wafer sample mapping with an automated edge-mapping tool and photo-metric alignment mechanism for alignment and pattern recognition. The low-light benchtop photometer is used for measuring thin-film optical characteristics on wafers. This is a precision-mechanical instrument that uses lasers and spectroscopy to measure reflectance, transmittance, and absorbance from patterned and un-patterned surfaces. It can also measure surface roughness and is capable of being managed through a control panel for automated operation. VEECO SP 3000 W also offers an automated software suite that allows for automated measurements and analysis. This suite includes a graphical user-interface (GUI) to control asset settings, including pattern and wafer mapping, calibration, and data analysis. It can also be used to compile a variety of measurements into a single report for easy viewing and printing. SP 3000 W is an advanced wafer testing and metrology model that offers reliable and accurate analysis of thin-film optical characteristics on patterned and un-patterned wafers. Its motorized wafer handling capabilities, optical measurement equipment, and automated software suite make it an ideal choice for researchers and engineers looking for a comprehensive, intuitive, and easy-to-use system.