Used ZEISS Surfcom 130A #9091160 for sale

ZEISS Surfcom 130A is a wafer testing and metrology equipment designed to provide precise and accurate measurements of semiconductor wafers. This system is capable of performing non-contact and non-destructive wafer analysis and provides users with the ability to accurately inspect, verify and measure the geometrical properties of a wafer. Surfcom 130A works by using advanced optical techniques to capture two-dimensional images of a semiconductor wafer's surface. These images are used to obtain precise and reliable measurements of the wafer's fundamental characteristics such as the spacing between lines and other geometric features. The unit includes a high-resolution CCD camera and an advanced optical bench which make it possible to capture two-dimensional images at a resolution of 0.9 µm, giving users accuracy and precision when inspecting and measuring semiconductor wafers. ZEISS Surfcom 130A also includes a powerful and easy-to-use control software, allowing users to control all machine parameters and data management tasks. This software allows the tool to be customized to suit the users' requirements, making it a versatile and powerful tool for wafer testing and metrology. The software also allows users to initiate measurements quickly and efficiently, while a variety of software-based algorithms and methods are available, providing users with the capability to perform advanced metrology tasks such as shape and profile analysis. Overall, Surfcom 130A offers users a powerful and accurate solution for metal and dielectric wafer analysis and measurement. With its advanced optical bench, high-resolution optics and powerful software, users can rest assured that their wafer measurements will be precise and reliable. This asset provides users with the flexibility to analyze and measure a wide range of semiconductor wafers, giving them the confidence that their measurements are accurate and precise.