Used ZYGO 7200-0100-01 #293621539 for sale

ZYGO 7200-0100-01 is a state-of-the-art wafer testing and metrology equipment, designed for quality control and process improvement in the semiconductor industry. Equipped with advanced optics, image processing, and automated measurement capabilities, 7200-0100-01 is capable of quickly, accurately, and repeatedly measuring the full range of surface features and characteristics of various substrates and materials. Its sophisticated signal synthesis and signal processing algorithms enable high-precision, multi-axis dynamic measurements, while its thermo-mechanical structures guarantee high-stability and repeatability. Equipped with an array of features, ZYGO 7200-0100-01 has a tilt plate with built-in motorized stage, high-resolution video camera, motorized turret mounted optical microscope, LED strobing light source with filtered optics, and automated auto-focus system. Its optical microscope is designed to measure the three-dimensional microscope field of view with maximum detail, allowing for the measurement of non-planar wafer surfaces. 7200-0100-01 also offers automated metrology functions, including the measurement of trenches, steps, and small features. The unit is capable of taking nine-axis measurements, together with several onboard computer-controlled imaging and analysis parameters, in order to achieve repeatable and reliable measurements in user-defined parameters. Furthermore, its high-precision calibrations enable the machine to maintain its accuracy over time, even after extended usage. Lastly, the tool offers various carrying cases, enabling it to be used in a variety of environments. ZYGO 7200-0100-01 is a powerful and reliable wafer testing and metrology asset that helps chip manufacturers maintain the quality of their products and ensure process improvement. Its advanced features, such as motorized stage, high-resolution video camera, motorized turret-mounted optical microscope, LED strobing light source, and automated auto-focus model, enable the equipment to measure various surfaces with high accuracy and repeatability. Furthermore, its nine-axis measurements capabilities make it a powerful tool for chip inspection and improvement.