Used ZYGO Zegage #293757848 for sale

ZYGO Zegage
ID: 293757848
Optical profilometer M/N: 6301-0100-01 P/N: 5300-0194-01 Objective: 10x, 0.3 NA.
ZYGO Zegage is a non-contact, non-destructive wafer testing and metrology equipment designed for semiconductor device manufacturing. Operated through a touchscreen interface, this is a series of automated digital imaging and measuring devices ideal for quality control and process optimization of the critical semiconductor components in a chip fabrication process. Zegage system uses dual scanning laser beams to quickly and accurately measure the three-dimensional shape of a wafer or die. The dual lasers provide a high-precision and rapid volumetric measurement of the topography of the wafer or die surface with no need for sample preparation or contamination. This means that this unit can take quick action measurements on multiple sample pieces with exacting accuracy. The machine comes equipped with options such as Power Probing Software, a software module which integrates coordinate measurement machine results with parametric data on the fly. This is useful for process monitoring in production processes. An additional option is the ability to batch process many sample pieces at once. ZYGO Zegage systems are designed with user-friendly ergonomics. An intuitive touchscreen interface displays a variety of user-friendly graphical representations and capable of displaying comprehensive measureables such as wafer thickness, diameter and volumes. A convenient help menu provides easy access to data points and real-time feedback for use in on-the-spot process optimization. Zegage also meets state of the art safety standards. This cutting-edge metrology tool is Class 1 Laser Safety-approved and throughout the qualification process has been certified with ISO 9001:2008 safety & quality standards. In summary, ZYGO Zegage is a perfect demonstration of the latest in wafer testing and metrology technology. With its dual scanning lasers and its user friendly interface, this asset offers highly accurate and rapid wafer testing and analysis. Highly dependable, this model meets stringent state of the art safety and quality requirements for semiconductor device fabrication.
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