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Marketplace
Scanning Electron Microscopes
JEOL
JIB 4700F
Used JEOL JIB 4700F for sale
Scanning Electron Microscopes
Manufacturer
JEOL
Model
JIB 4700F
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Vintage
2021
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Popular Product
JEOL
JIB-4700F
Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) Specimen stage Specimen exchange chamber Ga
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