Used KLA / TENCOR Archer 300 #9311042 for sale
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ID: 9311042
Wafer Size: 12"
Vintage: 2011
Overlay measurement system, 12"
Triple FOUP
Frontend: (3) Loadports
GEM / SECS and HSMS
E84 Enabled for OHT and AGV / RGV
(3) PIO Devices for OHT
E87 Based on E39
E40 / E94 / E90
CMP Measurement option
Adaptive noise reduction algorithm
Variable illumination spectrum
Color filter
(3) ADVANTAG Radio Frequency (RF) carrier ID Readers
Geometric model finder
Log recipe change file
S2 and CE Compliant
Signal tower
Operation manual on CD
Does not include Hard Disk Drive (HDD)
2011 vintage.
KLA / TENCOR Archer 300 is a leading inspection equipment for the mask and wafer industries, featuring a high-resolution imaging system and an advanced microprocessors. It is designed to meet the requirements of today's fast-moving semiconductor manufacturing environment, providing a reliable solution for detection and correction of defects in wafer and mask pattern photolithography. The unit utilizes dual x-ray cameras and automated algorithms, allowing operators to detect and analyze pattern defects quickly and accurately. The Automated Finding and Characterization (AFaC) function of the machine scans the inspected wafer or mask for defects, and then communicates the resulting images to the user. The tool also features an intuitive user interface for optimal usability. The asset supports multiple wafer and mask sizes, and is capable of detecting a wide range of defects. It can inspect wafers up to 8-inch or 20 cm in diameter and masks up to 1,2 m in size. The model utilizes advanced 4K imaging and automated inspection algorithms to enable faster detection and analysis of defects. In order to ensure optimal performance, the equipment is designed to be highly robust and reliable. It has a modular design that allows for easy installation, maintenance and troubleshooting. It has robust diagnostic functions and advanced thermal compensation techniques to ensure outstandingly stable inspection and measurement of defects. Additionally, the user can customize the inspection parameters to ensure optimal performance for their application. KLA Archer 300 is ideal for inspecting mask and wafer pattern photolithography across different layers and processes. It is a reliable tool for ensuring production quality that meets customer demands efficiently and cost-effectively. With its industry-leading performance, dependability and features, this system is a great choice for semiconductor manufacturers.
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