Used RUDOLPH / AUGUST NSX 105 #293615447 for sale

RUDOLPH / AUGUST NSX 105
ID: 293615447
Vintage: 2006
Macro defect inspection system WHS-300MM Wafer handler 2006 vintage.
RUDOLPH / AUGUST NSX 105 Mask & Wafer Inspection Equipment is designed for high precision inspection of wafers, masks and reticles used in the manufacture of microelectronic components. It is composed of a number of components including software, imaging system, optical head and control components. The software used in the unit is the WINNSX software package. This allows for the operation of the machine as well as customization of it to suit individual applications. It includes image acquisition and image analysis functions, as well as mask alignment and calibration routines. The software also includes various tools for defect detection and reporting. The imaging tool used in AUGUST NSX-105 is a CCD camera with a telecentric optics asset. The camera is used to collect digital images of the inspected objects. It is capable of capturing images of high resolution, as well as images taken in arbitrary directions for defect detection. The optical head is used to couple the CCD camera to the inspected objects. It is composed of a pair of objectives designed to collect light from the different parts of the inspected object. It also includes two high precision stages for positioning the camera over the inspected objects. The control components used in RUDOLPH NSX 105 are composed of a touch screen and a set of control buttons. They are used to control the imaging model, optical head and software. They also allow for customization of the equipment, as well as for easy operation and navigation. AUGUST NSX 105 is an advanced system for inspection and analysis of masks, wafers and reticles used in the manufacture of microelectronic components. It offers high precision inspection and defect detection, as well as the ability to customize it to suit individual applications. Its components, including the imaging unit, optical head and control components, make it an effective tool for the inspection and analysis of microelectronic products.
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