Used RUDOLPH / AUGUST NSX 105 #9293541 for sale

RUDOLPH / AUGUST NSX 105 is an efficient and reliable mask and wafer inspection equipment designed for use in the semiconductor manufacturing industry. It is a non-contact based system, using lasers and cameras to detect even the smallest chips, cracks, or stray particles on a product. The unit is able to detect particles and defects on the surface of product in order to assess product yield and quality. AUGUST NSX-105 features multiple cameras at different angles, enabling it to detect defects 0. 5um in size and up, while also offering unmatched sensitivity with a range of spot resolutions down to 13nm. It utilizes a number of proprietary algorithms and integrated pattern recognition software to guarantee accurate defect detection with high quality images. Additionally, the machine offers a fully automated workflow that supports parallel processing to speed up inspection time and enable rapid batch operations. RUDOLPH NSX 105 is capable of working with both 3D and 2D structures, making it an ideal option for manufacturers looking to inspect both planar and non-planar structures. It also includes multiple operating modes to support various workflows, such as area mode for large-scale inspections, line mode for inspecting a specific area, and point mode for quickly capturing images of small areas. The tool's hardware components include a test stage that is built for stability and accuracy and offers a variety of vacuum and clamps to accommodate various sample sizes. Additionally, the asset includes paired objective lenses that provide the highest magnification with superior optics that together produce ultra-high resolution images. The model's software is designed for ease-of-use, with intelligent edition functions that reduce the time required to detect and classify defects. It is capable of producing both grade images and defect reports to visualize results, with the option of exporting data in a variety of formats. To summarize, RUDOLPH / AUGUST NSX-105 mask and wafer inspection equipment is an efficient and reliable system designed specifically for use in the semiconductor industry. It features multiple cameras, proprietary algorithms, and a fully automated workflow that supports quick, accurate, and high quality defect detection. Its hardware is built for stability and accuracy while its software is designed to reduce the time required to detect and classify defects.