Used RUDOLPH / AUGUST NSX 105 #9400702 for sale

RUDOLPH / AUGUST NSX 105 is a mask and wafer inspection equipment designed for inspecting advanced semiconductor devices with small feature sizes. This system is capable of inspecting up to 10,000 wafer images per second and detecting defects as small as 0.6 microns. AUGUST NSX-105 can be used to inspect wafers with a feature size range of 75nm to 800nm. The unit comes equipped with a high-resolution 4kx4k CMOS Imaging Camera, allowing the user to inspect larger areas and accurately compare images side-by-side. In addition, the camera is able to detect any shortcomings, from open lines and shorts to watermarks and pattern shifts, that may have been caused during the manufacturing process. RUDOLPH NSX 105 also includes a software library of automated inspection scripts that enable improved job setup, data review, and detection speed. The machine utilizes a digital microscope, providing users with high-resolution images to quickly evaluate the product for quality defects. The microscope is equipped with a variety of objectives, lenses, and filters to help accurately detect and diagnose defects. The tool also comes with several advanced inspection algorithms, such as Edge Detection and 3D Lateral Step Height Mapping. These algorithms help to detect inconsistencies and flaws in the material, as well as to score the condition of the mask/wafer in order to grade the success of the process. NSX 105 is an ideal choice for inspecting silicon wafers at high-speed due to its high-resolution imaging capabilities and advanced automated functions. This asset is designed to be easy to set up and use, allowing the user to quickly and accurately inspect a large number of wafers with minimal effort. The model is well suited for use by semiconductor manufacturers and research laboratories, providing an easy and reliable means for quality assurance.