Used RUDOLPH Waferview 320 #9234643 for sale

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ID: 9234643
Macro defect inspection systems 2006 vintage.
RUDOLPH Waferview 320 is a high resolution mask and wafer inspection equipment designed for advanced inline defect inspection tasks. The system offers a unique combination of features to facilitate automated, high throughput quality inspection of masks and wafers with fine feature size. The unit is powered by a bright, high-fidelity 7 micron pixel resolution CCD camera paired with a 19/18/12um NA dual axis illumination train. This allows unmatched wafer and mask inspection precision with great clarity. The machine also has intuitive wafer handling and six-axis robot alignment that boosts the flexibility and versatility of the robot and wafer positioning. The inspection algorithms include multiple wafer inspection techniques, including topographical mapping, autofocus, defect mapping, feature differentiation, and fast go/ no go. These algorithms are complemented by comprehensive database integrations and a built-in defect tracking tool which can detect subtle differences in wafer shapes, features, and textures within minutes. Waferview 320 also features an optimized light path that exploits and controls the full range of image detail, ensuring full coverage from edge to edge. This allows for industry-leading detection of a wide variety of defects, from large scale defects to delicate, nearly invisible ones. Furthermore, the asset has an automated process for blank loop and pattern recognition which can be used to evaluate process quality anytime and map detected defects into process related coordinates. The construction of the model is robust and modular, minimizing mechanical vibrations and ensuring stable platform. The mechanical and optical data are tightly integrated in one indivisible unit, allowing users to save time by not dealing with multiple separate parts. Overall, RUDOLPH Waferview 320 mask and wafer inspection equipment is a powerful and reliable tool for any industrial application. It has comprehensive features that allow users to effectively detect and inspect defects, and an intuitive design that facilitates better workflow. By combining its world leading resolution, precision, and accuracy with its robust and modular design, this system is sure to help streamline inspections and guarantee high quality results.
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