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Marketplace
Wafer Testing And Metrology
N&K
5700CDRT
Used N&K 5700CDRT for sale
Wafer Testing And Metrology
Manufacturer
N&K
Model
5700CDRT
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Vintage
2005
(1)
With photos
(1)
N&K
5700CDRT
Resist thickness measurement system For photomask Broadband spectrometer Spot size: R 50um, T <400um
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N&K
5700CDRT
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