Used HITACHI S-5000H #9163121 for sale
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ID: 9163121
Scanning Electron Microscope (SEM)
Resolution:
0.6 nm at 30 kV
3.5 nm at 1 kV
Magnification: 30- 500x
Low magnification speed: 30-500x
High magnification speed: 250-800000x
Electron gun: Cold field emission source
Lens system: (3) Stage electromagnetic lenses
Objective: (4) Openings
Specimen exchange: Airlock type
Stage electromagnetic types: Stigmator (X,Y)
(2) Scanning coils
Specimen stage: Side entry type
Motion:
X: ±3.5 mm
Y: ±2 mm
Tilt: ±40ºC
Specimen size:
Standard holder size: 9.5 mm x 5 mm x 2.4 mm
Large specimen holder size: 20 mm x 6 mm x 2.4 mm
Power supply: 0.5-30 kV in 100 V.
HITACHI S-5000H is a state-of-the-art scanning electron microscope (SEM) that combines improved imaging speed with high-resolution imaging capabilities. This SEM offers a variety of imaging modes, including high-resolution imaging, high raster scan imaging, and high-speed imaging, to fulfill the demands of a wide range of applications. It also offers a unique capability to image secondary electronic signals (SEs) which are collected by the electron column. Thanks to its advanced analytical capabilities, it is well-suited for a wide range of research applications, including the characterization of materials, devices and life science research. This high-end instrument offers a variety of advanced functions and capabilities that enable superior imaging and analysis. Among its features include a wide range of sample stage movement (up to 50 mm/s with a maximum travel range of 170 mm), an open platform multi-view optics system, a five-axis high-resolution sample stage, and an automated specimen exchange (ASEX) controller. It also uses a field emission electron source to provide the highest possible brightness and resolution for imaging. HITACHI S 5000H employs proprietary image correction technology called Dynamic Space Warp Correction (DSWC), which corrects the aberrations caused by the various lens elements that compose the electron column. This allows for high-quality images with virtually no distortion. In addition, the ASEX controller is designed to bring accuracy and speed to a new level by allowing the system to switch between multiple specimens with one touch. It also allows for high-speed automated specimen handling with repeatable specimen alignment. S-5000 H is also fitted with an integrated energy filter for energy dispersive X-ray spectroscopy (EDS). This feature enables quantitative analysis of elements at the nano-level to study material composition, providing invaluable data on crystal structure and chemical properties. In addition to the advanced features mentioned above, S 5000H is equipped with a wide range of imaging software that allows the user to operate the system with ease. Operators are able to control a variety of functions for optimized imaging and analysis of a variety of samples. It also offers a range of analytical options like automated scanning for imaging or analytical measurements, automated surface imaging, and automated thickness measurement. Overall, S-5000H provides an outstanding level of performance, versatility, and usability required for a sophisticated scanning electron microscope. Thanks to its improved imaging and automated functions, HITACHI S-5000 H is ideal for a range of applications from materials and device research to life science research.
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