Used JEOL JEM 2010F #293590723 for sale

JEOL JEM 2010F is an environmental scanning electron microscope (ESEM) used for high-resolution imaging of a variety of sample types. This advanced piece of equipment is capable of producing superior resolution images of biological and inorganic samples down to 20 nm. The microscope has a variable pressure chamber allowing imaging of non-conductive materials and minimizes the charging effect of non conductive specimens. JEOL JEM-2010F is equipped with a field emission gun and a high resolution, beryllium-based, LaB6-type cathode. The energy of the electron beam is adjustable, allowing optimal imaging of various sample types. The X-Ray microanalyzer on board JEOL is capable of providing atomic-level information on the sample composition. The microscope is fully automated, including a motorized navigation system to ensure accuracy of position and navigation of the sample. The sample can be further adapted to enable optimal contrast and resolution by utilizing a variety of lenses and apertures that come as standard. JEOL is ideal for applications such photomicrography, biological sample imaging, metallographic analysis, ceramic and crystal microstructures, engineering ceramic sample analysis and research. JEM 2010F main stage has a temperature range from 0-50°C and the optional low temperature option extents this range from -160 to 105°C offering a wide choice of imaging applications. Using cryogenics, the microscope is suitable for imaging frozen samples, making it ideal for medical applications such as histology. JEM-2010F is an incredibly powerful and comprehensive package capable of meeting even the most demanding imaging requirements. Its broad range of capabilities qualifies it for a wide range of applications in research, industry, and medical fields.