Used JEOL JEM 2010F for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JEM 2010F

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Transmission Electron Microscope (TEM).

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Scanning Transmission Electron Microscope (STEM) UHR Objective pole Spherical aberration coefficien

105

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Transmission Electron Microscope (TEM) Ultra High Resolution (UHR) / High Resolution (HR) / High sp

153

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Transmission Electron Microscope (TEM) With STEM No cryo holder Does not include accessories.