Used JEOL JEM 2010F #9253109 for sale

JEOL JEM 2010F is an advanced scanning electron microscope (SEM) featuring superb imaging capability. The system offers high-quality, large-magnification images with a very fine resolution of up to 0.2nm. This is achieved by a cold field emission source and special low vibration technology, resulting in better contrast and higher resolution images. The 2010F is capable of fast sample preparation thanks to its automated loading system, which enables swift sample transfer from the holder to the imaging chamber. A wide variety of sample preparation methods are available, such as vacuum measuring of water vapor and DEBIE™ sputter coating. The 2010F incorporates a variety of analysis functions for high-performance imaging. Energy-dispersive X-ray spectroscopy (EDS) is available to enable elemental analysis of samples. EDX mapping can be used to map compositional distributions over the sample surface. The 2010F comes with a customizable graphical user interface (GUI) which enables quick access to the microscope's settings and the choice of the most suitable imaging parameters. The 2010F has a large chamber size of 200 mm for single axis tilt, making large area mapping fast and efficient. The system also has a detector stage which rotates through 360° for monitoring the sample from multiple angles. The 2010F can be used in various industries, including medicine, materials science, nanotechnology and electronics. It is suitable for a variety of sample types, ranging from biological samples to organic and inorganic substances. The 2010F is designed to require only minimal maintenance. Low power consumption and high reliability; mean the 2010F is an ideal choice for a wide range of applications.