Used JEOL JEM 2010F #293621943 for sale

JEOL JEM 2010F is a scanning electron microscope designed for high resolution applications on a broad range of samples. It features excellent sensitivity, stability and an observation magnification up to one million times depending on the specimen. The field emission electron source ensures a high-quality image with a low beam-induced damage to the sample. JEOL JEM-2010F is designed with a low-vacuum chamber that eliminates the need for water cooling and reduces maintenance to minimum levels. This scanning electron microscope features an exceptional level of stability, with a signal-to-noise ratio of 200:1, ensuring crisp images and distortion-free measurements. In addition, JEM 2010F has a highly flexible observation mode, with the ability to detect backscattered electrons, secondary electrons, inelastic electrons, photoelectrons and Auger electrons. Combined with an extensive choice of detectors, the equipment is capable of analyzing a variety of sample types. JEM-2010F also comes with a range of advanced technologies and accessories to enhance its imaging capabilities. These include a dual-beam system that allows for simultaneous imaging in two different ways, for example SEM/TEM, or STEM/EDX. TheAdvanced Analytical Unit (AAS) option provides automated collection of analytical data. Another useful feature is the user-friendly sample handling machine, which enables easy exchange of specimens and sample holders during observation. Overall, JEOL JEM 2010F is an incredibly powerful and versatile scanning electron microscope, enabling detailed investigation of a variety of samples. Its advanced technologies make it the ideal tool for a broad range of research and analysis.