Used JEOL JEM 2010F #9235270 for sale

JEOL JEM 2010F is a high-performance scanning electron microscope (SEM) engineered to meet the demands of advanced imaging and analytical requirements across a variety of applications. The equipment, with its advanced optics, is designed to offer the highest resolution images with superior depth of focus, even at low accelerating voltages. JEOL JEM-2010F is equipped with a variety of technology to maximize imaging efficiency. The column utilizes a 20 mm deflection electron optical system to reduce unit loading and scanning distortion while delivering unparalleled resolution, contrast, and image clarity. In addition, automated FEG controls, a unique signal detection/correction circuit, and the ability to increase the beam dose allows for optimized imaging of even the most challenging samples. JEM 2010F also incorporates superior hardware and software components to accommodate a range of analytical capabilities, from EDXRF to EBSD/EPMA. The integrated EDXRF machine performs rapid X-Ray analysis while the built-in EBSD/EPMA tool allows for the characterization of a variety of inorganic and organic materials, including semiconductors and nano-materials. With regard to user-friendliness, the Easy Auto-Focus (EAF) function enables a simple and effortless operation of the microscope. The EAF mode is ideal for working with samples with uneven surface characteristics. The asset's Stability Monitor also ensures that the specimen is kept under constant observation and allows for the reliable operation of the instrument over extended periods of time. With its combination of cutting edge technology and user-friendly features, JEM-2010F scanning electron microscope is the ideal instrument for a broad range of scientific and industrial applications. By providing the highest levels of image quality and analytical performance, this model is designed to exceed the most demanding imaging requirements.