Used JEOL JSM 6100 #9147721 for sale

ID: 9147721
Scanning electron microscope (SEM) Resolution: High vacuum mode: 3.0 nm(30kV) Low vacuum mode: 4.0 nm(30kV) Accelerating voltage: 0.3 to 30 kV Magnification: x5 to 300,000 Filament: Pre-centered w hairpin filament (with continuous auto bias) Objective lens: Super conical lens.
JEOL JSM 6100 scanning electron microscope (SEM) is a high-performance imaging device used in a variety of applications such as material analysis, nanotechnology, and life sciences research. This advanced SEM produces high-resolution images with a maximum resolution of up to 16 nm, and provides full automated, ultra-fast image acquisition. The SEM also has a variety of imaging modes, such as backscattered electron, secondary electron, and cathodoluminescence imaging which allow for the observation of a wide variety of sample types. JSM 6100 features an advanced scanning electron optics equipment, which provides unmatched image quality and unmatched depth of field. It comes with a large field of view, up to 55 mm diagonal, and is capable of obtaining even finer details over a greater area than rival systems. The instrument also features an intuitive user interface with an easy-to-use touch-screen panel. This allows for intuitive operation and minimal user training. The SEM is powered by a high-performance detector and a high-resolution digital video acquisition system. In addition, the SEM is equipped with an automated sample stage with a large variety of specimen holders as well as automated stage scanning capabilities. This allows for the acquisition of large datasets quickly and easily. The SEM utilizes a 10 keV to 25 keV auto-adjustable electron gun unit which makes it highly versatile for a variety of applications. It has a unique beam deceleration circuit which can accelerate and decelerate electrons to precise levels to eliminate static charging in sensitive samples. JEOL JSM 6100 is also designed for low-vibration operation, with noise levels below 50dB, enabling it to produce high-quality images in a variety of environments. In addition, it features multiple PC-style external interfaces and an extended range of image analysis and evaluation capabilities. Overall, JSM 6100 is a powerful and reliable scanning electron microscope that offers an unmatched combination of imaging performance, user, and environmental features. With its advanced SEM optics machine, intuitive user interface, and fully automated sample stage, JEOL JSM 6100 is ideally suited for a variety of applications.
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