Used JEOL JSM 6100 for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6100

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Scanning Electron Microscope (SEM) With imaging system.

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Scanning Electron Microscope (SEM).

129

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Scanning electron microscope (SEM).

188

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Scanning electron microscope (SEM) Resolution: High vacuum mode: 3.0 nm(30kV) Low vacuum mode: 4.0

276

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Scanning Electron Microscope (SEM) 200 VAC, 15A, 1 phase, 50/60 Hz, 3 kVA.

201

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Scanning Electron Microscope (SEM), parts machine.

113

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Scanning electron microscope (SEM) Parts machine.

124