Used JEOL JSM 6100 #9226960 for sale

JEOL JSM 6100 is a scanning electron microscope (SEM) designed for high resolution imaging. It is capable of producing images with much higher spatial resolution than traditional optical microscopes, making it a powerful tool for studying the nanoscale structures of many materials. JSM 6100 is equipped with field emission scanning electron source (FESEM) that provides better signal to noise ratio and higher resolution than thermal emission SEMs. In the FESEM configuration, it has resolution capabilities down to 0.7 nm in the secondary electron mode and 1.5 nm in the backscattered electron mode. JEOL JSM 6100 utilizes a scanning stage that features two-axis deflection coils and computer-controlled sample manipulation. It has a 12 um range of motion, allowing for quick and accurate imaging. JSM 6100 also features a large working distance of 25 mm, allowing for easy specimen manipulation and placement without damaging delicate samples. JEOL JSM 6100 also comes with many advanced imaging features. These include angle-resolved imaging, which allows for mapping of the surface's many features in precise detail. It also features composition analysis, enabling the chemical composition of a specimen to be easily determined. JSM 6100 offers variable pressure imaging, which allows for imaging under a range of vacuum pressures, allowing for features smaller than the resolution limit of the instrument to be observed. JEOL JSM 6100 comes equipped with an EDS (energy dispersive spectrometry) detector for elemental analysis. This detector is capable of detecting elements from the periodic table down to less than 1% detection limit. JSM 6100 also features ultra-high resolution imaging mode, allowing for imaging of features down to 0.3 nm. Overall, JEOL JSM 6100 is a powerful and versatile scanning electron microscope equipped with numerous advanced features, perfect for imaging and analysis of nanoscale structures.