Used JEOL JSM 6100 #9224652 for sale

JEOL JSM 6100 is a scanning electron microscope (SEM) designed to perform surface inspections and analysis of a range of samples. It has a high-resolution, large field of view and a variable pressure equipment, making it well-suited for observation and analysis of samples with fine geometrical structures. JSM 6100 has a maximum output of 30 kV and a maximum magnification of 90,000 times. The microscope is equipped with a field emission gun (FEG) electron source, which provides greater stability and higher energy utilization compared to other sources. This allows for superior resolution and imaging quality. The microscope is able to provide three types of scan data, ranging from true plan-view to depth profile images. Additionally, a digital image system is available for observation and display of the sample. The sample can be prepared for photography using a range of techniques, including beam-induced deposition, coating by sputter coating, and chemical vapor deposition. With a snapshot time of less than two seconds, JEOL JSM 6100 allows for rapid processing of samples and subsequent viewing. JSM 6100 also offers several automated analysis functions. These include three specialized modes which can be used to perform backscatter imaging, EDX elemental analysis, and electron back-scatter diffraction. Additionally, the microscope allows for automated alignment and focus control, meaning that sample alignment and optimal focus can be achieved quickly and accurately. In addition to JEOL JSM 6100, JEOL offers a range of accessories for further customization of the unit. This includes various vacuum components, such as a sample loader and chamber heating machine; microscope stages, such as stepper motors for sample movement; and detectors, such as X-ray, secondary electron, backscatter electron and cathodoluminescence detectors. These components can be used to customize the tool and extend its capabilities to the user's specific needs. Overall, JSM 6100 SEM is a powerful, sophisticated asset which can be used for a range of applications. Its high resolution, wide field of view, and advanced imaging and analysis features make it ideal for observation and analysis of samples with fine detail. With the ability to rapidly process and display data, JEOL JSM 6100 SEM is an efficient tool for surface inspection and analysis.