Used JEOL JSM 6100 #9239600 for sale

JEOL JSM 6100 is one of the most advanced scanning electron microscopes (SEMs) available, designed for superior imaging performance and precise sample analysis. It utilizes a field-emission type electron source and a newly designed twin-lens optical equipment which allows for the detection of secondary electrons down to an atomic level. JSM 6100 is capable of magnifications up to 300,000 times, with a scan resolution of 20nm, and a Z axis resolution of 0.1nm. It has a high-speed scan system, which enables quick imaging of specimens, providing accurate data quickly. An image stitching function ensures that images produced are of the highest quality possible, while a built-in EDX detector allows users to acquire precise elemental analysis of the scanned sample. JEOL JSM 6100 incorporates a user-friendly operations mode, which provides the user with easy operation and setup of the SEM. Scanning parameters can be preset into the device, while the multiple viewing modes allow users to observe and analyze sample images in real-time. A digital camera is also built into the microscope, enabling users to capture high-resolution digital images and facilitate easy sharing of results via the computer. JSM 6100 offers several automated functions that streamline the imaging and analysis process. An automated specimen checkout unit ensures that specimens are properly prepared and mounted for scanning. The focus machine will automatically detect the sample surface and adjust necessary settings, removing the need for manual fine-tuning. An automatic scan area size and shape selection tool is also incorporated into the microscope, allowing a range of scan sizes to easily be selected. JEOL JSM 6100 is one of the most powerful SEMs available, providing a high level of imaging performance and automated operations. It is capable of producing high-resolution images of samples on the atomic level, while providing precise elemental analysis via its EDX detector. Streamlined automated systems help to speed up the scanning process, allowing even novice users to acquire exceptional results quickly and easily.