Used JEOL JSM 6100 #9240232 for sale

JEOL JSM 6100 is an advanced scanning electron microscope (SEM) designed for detailed imaging and analysis of a variety of materials. It features impressive levels of resolution, with magnification capabilities up to a maximum of 50,000x. The microscope has high-resolution secondary electron imaging, backscattered electron imaging and high resolution transmission electron imaging capabilities, which can be used to analyze surfaces and interfaces of samples. The microscope is also equipped with an autonomously scanning stage which can generate high-resolution computed tomography and 3D models of samples. This is aided by the high-resolution, three-dimensional visualization capabilities. This microscope also has a large chamber which can accommodate larger samples. The 6100 is operated by a user-friendly software platform. It features scripting capabilities, which allow for analysis of many samples at once. The software also offers 3D image reconstruction capabilities, as well as two-dimensional statistical analysis. The specimen chamber is outfitted with a rugged specimen holder, which is designed to make specimen loading and unloading easier. The chamber also features high-vacuum pressures, enabling a greater range of material analysis. Finally, JSM 6100 also includes an optional energy dispersive spectroscopy (EDS) system. This adds additional capabilities to the microscope, including compositional analysis of samples. It also allows for mapping and quantitative analysis of samples. In conclusion, JEOL JSM 6100 is a high-performance scanning electron microscope designed for precise and detailed imaging of material samples. It offers a wide variety of features, including high-resolution imaging, 3D visualization, autonomous scanning stage and energy dispersive spectroscopy capabilities. This allows researchers to get a detailed analysis of samples down to the atomic level.